Luna’s family of advanced optical test and measurement products
are based on optical frequency domain reflectometry (OFDR)
and deliver industry leading dynamic range, resolution and speed.

 


 

Luna 6415
• High-speed analyzer for production test and quality control
• Reflectometer and transmission analyzer combined in single instrument
• Measure distributed loss versus length with very high resolution
• Spectral analysis of transmission and reflection paths

 


 

OVA Component Analyzers
• Complete characterization of waveguide devices
• Full polarization analysis without need for polarization controller or aligned PM fiber
• Instantaneous measurement of IL, RL, PDL, PMD, TE/TM states, waveguide scatter, and more in less than 3 seconds

 


 

OBR Reflectometers
• Unprecedented visibility into the details of silicon photonics, PICs and fiber optic components
• 10 μm resolution; -140 dB sensitivity
• Waveguide scattering and loss easily measured and analyzed 

 


 

Tunable Lasers
• Full C-band tunability
• Smooth, linear scans
• Industry-leading wavelength accuracy and resolution
• Integrated wavelength and power monitors
• Superior noise characteristics